This Journal
- Honorary Editor-in-Chief: Jue Zhong
- Central South University, People's Republic of China
- Editor-in-Chief: Dongming Guo
- Dalian University of Technology, People's Republic of China
- International Editor-in-Chief: Yongfeng Lu
- University of Nebraska-Lincoln, United States of America
- CN 51-1794/TH
- ISSN 2631-8644
- EISSN 2631-7990
NewsMORE
- [Featured Article]The fabrication, characterization and functionalization in molecular electronics
- [Featured Article]Laser-induced microjet-assisted ablation for high-quality microfabrication
- [Featured Article]Optical Wafer Defect Inspection at the 10 nm Technology Node and Beyond
- [News]Celebrating Our 3rd Anniversary！
- [Special Theme]Special Theme on “Multiscale Manufacturing towards Flexible Hybrid Electronics” at IJEM
- [Featured Article]Localized Electrodeposition Micro Additive Manufacturing of Pure Copper Microstructures
Newly Published Articles
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2022, 4(3): 032001.
doi:
10.1088/2631-7990/ac64d7
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2022, 4(3): 032002.
doi:
10.1088/2631-7990/ac64d6
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2022, 4(3): 032003.
doi:
10.1088/2631-7990/ac670b
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2022, 4(3): 032004.
doi:
10.1088/2631-7990/ac7617
Most cited
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2020, 2(2).
doi:
10.1088/2631-7990/ab8d9a
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2019, 1(1).
doi:
10.1088/2631-7990/ab0dfc
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2019, 1(2).
doi:
10.1088/2631-7990/ab1ff1
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Browse by Subjects
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Topical Reviews
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Material Interactions with Energy Beams and Fields
--Materials science
--Models and experiments for energy fields
--Mechanism of interaction between materials and tools show more > -
Approaches and Theories of Processing
--Generation of complex and hierarchical structures
--Ultrahigh accuracy machining
--High-energy beam machining show more > -
Metrology and Characterization
--Measurement on extreme scales
--Methods and algorithms
--Accuracy evaluation
--Performance verification of systems show more > -
Equipment and Systems
--Fundamentals of extreme manufacturing systems
--Systems development under extreme environments
show more > -
Extreme Conditions
--Laser fusion
--Ultrahigh pressure
--Cryogenic temperature
--High-intensity magnetic field show more >
