This Journal
- Honorary Editor-in-Chief: Jue Zhong
- Central South University, People's Republic of China
- Editor-in-Chief: Dongming Guo
- Dalian University of Technology, People's Republic of China
- International Editor-in-Chief: Yongfeng Lu
- University of Nebraska-Lincoln, United States of America
- CN 51-1794/TH
- ISSN 2631-8644
- EISSN 2631-7990
NewsMORE
- [News]Celebrating the 4th Anniversary of International Journal of Extreme Manufacturing and beyond
- [Featured Article]In-situ Ni alloying enhanced laser aided additively manufactured Ti-6Al-4V alloy
- [Featured Article]The fabrication, characterization and functionalization in molecular electronics
- [Featured Article]Laser-induced microjet-assisted ablation for high-quality microfabrication
- [Featured Article]Optical Wafer Defect Inspection at the 10 nm Technology Node and Beyond
- [News]Celebrating Our 3rd Anniversary！
Newly Published Articles
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2024, 6(1): 012001.
doi:
10.1088/2631-7990/acfc03
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2024, 6(1): 012002.
doi:
10.1088/2631-7990/acfcf1
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2024, 6(1): 012003.
doi:
10.1088/2631-7990/acfbc3
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2024, 6(1): 012004.
doi:
10.1088/2631-7990/acfd67
Most cited
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2020, 2(2).
doi:
10.1088/2631-7990/ab8d9a
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2019, 1(1).
doi:
10.1088/2631-7990/ab0dfc
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2021, 3(3).
doi:
10.1088/2631-7990/ac087c
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Browse by Subjects
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Topical Reviews
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Material Interactions with Energy Beams and Fields
--Materials science
--Models and experiments for energy fields
--Mechanism of interaction between materials and tools show more > -
Approaches and Theories of Processing
--Generation of complex and hierarchical structures
--Ultrahigh accuracy machining
--High-energy beam machining show more > -
Metrology and Characterization
--Measurement on extreme scales
--Methods and algorithms
--Accuracy evaluation
--Performance verification of systems show more > -
Equipment and Systems
--Fundamentals of extreme manufacturing systems
--Systems development under extreme environments
show more > -
Extreme Conditions
--Laser fusion
--Ultrahigh pressure
--Cryogenic temperature
--High-intensity magnetic field show more >
